Separating the Wheat from the Chaff in Nanotechnology Research Data
An incremental improvement to statistical analysis could lead to significant improvement in nanotech research
Researchers at Georgia Tech have developed a statistical analysis technique that will enable researchers to better distinguish between unwanted equipment-based artifacts in nanoscale measurements and true nanoscale phenomenon.
As I pointed out last month, it’s a hard and time-consuming process to design a nanomaterial. But this new statistical analysis technique is supposed to shorten the process by reducing the amount of experimental data required in order to reach a conclusion.
While huge transformational developments that may or may not happen capture the imagination of both the mainstream and industry press, it is the incremental improvements like this that lead to significant changes in the long run.
Dexter Johnson is a contributing editor at IEEE Spectrum, with a focus on nanotechnology.
