Separating the Wheat from the Chaff in Nanotechnology Research Data

An incremental improvement to statistical analysis could lead to significant improvement in nanotech research

1 min read

Researchers at Georgia Tech have developed a statistical analysis technique that will enable researchers to better distinguish between unwanted equipment-based artifacts in nanoscale measurements and true nanoscale phenomenon.

As I pointed out last month, it’s a hard and time-consuming process to design a nanomaterial. But this new statistical analysis technique is supposed to shorten the process by reducing the amount of experimental data required in order to reach a conclusion.

While huge transformational developments that may or may not happen capture the imagination of both the mainstream and industry press, it is the incremental improvements like this that lead to significant changes in the long run.

 

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The Transistor at 75

The past, present, and future of the modern world’s most important invention

1 min read
A photo of a birthday cake with 75 written on it.
Lisa Sheehan
LightGreen

Seventy-five years is a long time. It’s so long that most of us don’t remember a time before the transistor, and long enough for many engineers to have devoted entire careers to its use and development. In honor of this most important of technological achievements, this issue’s package of articles explores the transistor’s historical journey and potential future.

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