Sometimes art is accidental. At IEEE's 18th International Symposium on the Physical and Failure Analysis of Integrated Circuits, held 4 to 7 July in Incheon, South Korea, participants submitted pictures of surreal and spectacular close-ups of microchips, competing for the most affecting image. This is the fourth year IEEE Spectrum has featured the finalists from IPFA's "Art of Failure Analysis" contest. Click on the links for winners from 2010, 2009, and 2008.
If you are viewing this page with an iPad or iPhone, click here to launch the slideshow:
The Conversation (0)
Keeping Moore’s Law Going Is Getting Complicated
24 May 2023
5 min read