We are at the beginning of an automotive electronics explosion. The combined move towards electric vehicles and autonomous driving is resulting in a rapid increase in both the number and complexity of electronic components integrated within a car. This rapid change is creating challenges for both device suppliers and integrators as they scramble to understand and define critical quality and reliability requirements and implementation solutions driven largely by the ISO 26262 standard. This webinar will review new and evolving semiconductor test quality and reliability solutions aimed at addressing these evolving functional safety requirements.
Matt Miller, Senior Scientist, Electro Magnetic Applications (EMA)
Matt Miller is a Senior Scientist at Electro Magnetic Applications (EMA) where he leads a group providing analysis services for cosite interference, installed antenna performance and radar signature prediction. Mr. Miller has 20 years of experience in electromagnetics, business development, marketing and sales. Mr. Miller worked for The Boeing Company from 1998-2001 as an Electromagnetic Effects (EME) engineer supporting various defense and space programs providing analysis in the areas of antenna-to-antenna coupling, electro-static discharge (ESD), lightning effects, receiver intermodulation product generation and shielding effectiveness. From 2001-2005, Mr. Miller worked for SAIC-DEMACO in Champaign, IL as a Research Scientist performing code development and analysis for various types of electromagnetic phenomena. In 2005, Mr. Miller co-founded Delcross Technologies, LLC where he served as the President. Delcross developed commercial simulation tools for cosite interference, installed antenna performance and radar signature prediction.