We are at the beginning of an automotive electronics explosion. The combined move towards electric vehicles and autonomous driving is resulting in a rapid increase in both the number and complexity of electronic components integrated within a car. This rapid change is creating challenges for both device suppliers and integrators as they scramble to understand and define critical quality and reliability requirements and implementation solutions driven largely by the ISO 26262 standard. This webinar will review new and evolving semiconductor test quality and reliability solutions aimed at addressing these evolving functional safety requirements.
Stephen Pateras, Mentor Graphics
Stephen Pateras is product marketing director within Mentor’s Tessent group and has responsibility for the company’s BIST and automotive semiconductor test solutions. His previous position was VP Marketing at LogicVision where he was instrumental in defining and bringing to market several generations of LogicVision’s semiconductor test products. From 1991 to 1995, Dr. Pateras held various engineering lead positions within IBM’s mainframe test group.
Dr. Pateras received his Ph.D. in Electrical Engineering from McGill University in semiconductor test and has spent his entire career in positions related to the usage or specification of semiconductor test solutions. He has written and has had published numerous articles and papers in the semiconductor test field and regularly speaks and sits on panels at different semiconductor test conferences around the world.