The Art of Failure 2014

Failure-analysis experts find some funny stuff in semiconductors

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The Art of Failure 2014
Image: Lew Li Lian/GlobalFoundries

Photo: Lew Li Lian/GlobalFoundries
Birdie in the Hole: This little bird sits contentedly under the microscope’s gaze, but it didn’t fly there on its own. According to Lew Li Lian from GlobalFoundries, in Singapore, “A particle in the hole caused a cavity formation in the precoat material, resembling a birdie.” It won first prize at the 2014 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Art of Failure Analysis contest.

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