The Art of Failure 2012

Failure analysts show off the strange stuff they find in their microscopes

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Samuel K. Moore is IEEE Spectrum’s semiconductor editor.

Photo: Tan Lee Koon/Systems-on-Silicon Manufacturing Co.
The Hope Terrace: The chipping at the edge of a silicon wafer, when examined under a scanning electron microscope, looks like an inspiring bit of geography, according to third-prize winner Tan Lee Koon.
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