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SemiconductorsTopicSlideshowType

The Art of Failure 2012

Failure analysts show off the strange stuff they find in their microscopes

0 min read
devicestype:slideshowArt of FailureIPFAfocused ion beamfailureintegrated circuitsscanning electron microscopefailure analysistransmission electron microscope

Photo: Lim Saw Sing/Infineon Technologies
People on the Beach: That’s what Lim Saw Sing saw in this scanning electron microscope image. Lim, who works at Infineon Technologies’ facility in Kulim, Malaysia, exposed a polyimide surface to etching by reactive ions. The resulting image won first prize at the 2012 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012).
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devicestype:slideshowArt of FailureIPFAfocused ion beamfailureintegrated circuitsscanning electron microscopefailure analysistransmission electron microscope
The Conversation (0)
a person wearing an astronaut suit while looking out over black and white rocky terrain with crescent of Earth in the background
AerospaceTopicTypeComputingNews

Cybersecurity Gaps Could Put Astronauts at Grave Risk

5 min read
colorful text on a black background
ComputingTopicNewsType

TLA+ Helps Programmers Squash Bugs Before Coding

3 min read
An illustration of people walking in a city with a large green globe behind them.
Artificial IntelligenceTopicMagazineTypeOpinionJune 2023

AI Everywhere, All at Once

3 min read