IEEE Spectrum
FOR THE TECHNOLOGY INSIDER

Topics

AerospaceArtificial IntelligenceBiomedicalClimate TechComputingConsumer ElectronicsEnergyHistory of TechnologyRoboticsSemiconductorsTelecommunicationsTransportation

Sections

FeaturesNewsOpinionCareersDIYEngineering Resources

More

NewslettersPodcastsSpecial ReportsCollectionsExplainersTop Programming LanguagesRobots Guide ↗IEEE Job Site ↗

For IEEE Members

Current IssueMagazine ArchiveThe InstituteThe Institute Archive

For IEEE Members

Current IssueMagazine ArchiveThe InstituteThe Institute Archive

IEEE Spectrum

About UsContact UsReprints & Permissions ↗Advertising ↗

Follow IEEE Spectrum

Support IEEE Spectrum

IEEE Spectrum is the flagship publication of the IEEE — the world’s largest professional organization devoted to engineering and applied sciences. Our articles, podcasts, and infographics inform our readers about developments in technology, engineering, and science.
Join IEEE
Subscribe
JOIN IEEESIGN IN
Close

Access Thousands of Articles — Completely Free

Create an account and get exclusive content and features: Save articles, download collections, and talk to tech insiders — all free! For full access and benefits, join IEEE as a paying member.

SemiconductorsTopicSlideshowType

The Art of Failure 2012

Failure analysts show off the strange stuff they find in their microscopes

0 min read
devicestype:slideshowArt of FailureIPFAfocused ion beamfailureintegrated circuitsscanning electron microscopefailure analysistransmission electron microscope

Photo: Lim Saw Sing/Infineon Technologies
People on the Beach: That’s what Lim Saw Sing saw in this scanning electron microscope image. Lim, who works at Infineon Technologies’ facility in Kulim, Malaysia, exposed a polyimide surface to etching by reactive ions. The resulting image won first prize at the 2012 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012).
1/10
devicestype:slideshowArt of FailureIPFAfocused ion beamfailureintegrated circuitsscanning electron microscopefailure analysistransmission electron microscope
The Conversation (0)
A group of gold IEEE Medals on black background.
The InstituteTopicTypeNews

It’s Time to Nominate a Coworker for an IEEE Top-Level Award

3 min read
a black panel with different colored lights sitting on top of it with a computer monitor in the background
TelecommunicationsTopicTypeNews

A Simpler Means for Visible Light Communication

2 min read
blue dots connected in the shape of Earth
Climate TechTopicTypeNews

A Neural Network Takes Asia's Air Temperatures

3 min read