Photo: Lim Saw Sing/Infineon Technologies
People on the Beach: That’s what Lim Saw Sing saw in this scanning electron microscope image. Lim, who works at Infineon Technologies’ facility in Kulim, Malaysia, exposed a polyimide surface to etching by reactive ions. The resulting image won first prize at the 2012 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012).
1/10










Samuel K. Moore
Samuel K. Moore is the senior editor at IEEE Spectrum in charge of semiconductors coverage. An IEEE member, he has a bachelor's degree in biomedical engineering from Brown University and a master's degree in journalism from New York University.
The Conversation (0)