Image: Ho Mun Yee
Those who discovered this image likened it to a bird’s-eye view of an expansive metropolis, but it actually shows copper metal “rising up” from a silicon oxide base. Analysts etched away at the silicon oxide with a focused beam of ionic gas while the copper remained intact.
Just as one man’s trash is another man’s treasure, one person’s systems failure is another one’s masterpiece. This is the third year that the “Art of Failure Analysis”was featured at the IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). Participants submitted the most intriguing images they’d captured during chip autopsies. Favorite pictures from the collection, which range from charming to just plain creepy, were on display at the symposium from 5 to 9 July in Singapore.
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