Image: Foo Fang Jie
This stoic-looking robot was spied while engineers were preparing a die for transmission electron microscopy. The face appeared as the copper metal layers were being thinned using a focused ion beam machine.
Just as one man’s trash is another man’s treasure, one person’s systems failure is another one’s masterpiece. This is the third year that the “Art of Failure Analysis”was featured at the IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). Participants submitted the most intriguing images they’d captured during chip autopsies. Favorite pictures from the collection, which range from charming to just plain creepy, were on display at the symposium from 5 to 9 July in Singapore.
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