Tag Results for National Instruments (28)

  1. Adaptive Test: Addressing the Challenge of “Zero Defect” IC Quality

    Adaptive test methods fall into two broad categories: those that exploit the statistics of defect distribution on wafers, and those that exploit the correlation in the variation of process and performance parameters on wafers. We present test methodologies that span both these categories, and illustrate their effectiveness with results from recently published experimental studies on automotive parts.

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