Spectrum Webcasts

Tech Insider: Low-Cost Testing In Next-Generation Test & Measurement Markets

"On Demand"

Sponsored by Agilent Technologies and Keithley Instruments

Presenters
Mark Elo, RF Marketing Director, Keithley Instruments
Phil Lorch, Emerging Communications and Cellular Marketing Manager, Signal Analysis Division, Agilent Technologies
Steven Thomas, Product Manager, Anritsu

With the demand for lower-cost and more functionality in mobile communications, RF testing is evolving to accommodate higher levels of integration with new design challenges. The development of new, more complex, wireless devices has increased the demand for systems-on-a-chip (SoC) with higher levels of technical sophistication.

In this Webinar, industry experts will discuss:

• How test and measurement manufacturers are responding to the demand for instruments that permit more comprehensive testing with more speed and accuracy
• What the next-generation test systems will look like

Who Should Attend:

• Test Engineers
• Design Engineers
• Project Managers
• Network Operators
• Software Developers
• Engineering Management