NIST Reveals Reliability Problems with Carbon Nanotubes in Electronics
Poor old carbon nanotubes. CNTs have long been heralded as the new wonder material, especially in electronics applications where their charge-carrier mobility was able to outperform silicon—according to some estimates by a factor of 10—but researchers have struggled to find a satisfactory proposal for getting them into some kind of ordered array.
While researchers have continued for the last 20 years to push CNTs beyond a single transistor or attempted to use their propensity for forming a rat’s nest as a strength rather than a weakness, they have faced the unexpected problem over the last decade of their toxicological issues.
As I said, poor old CNTs. So it should come as no surprise in the tale of woe that has followed CNTs that NIST should report CNTs have a major reliability issue in electronics.
The research was presented in a paper at the recent IEEE Nano 2011 in Portland, Oregon. From the NIST Web site:
“…NIST researchers fabricated and tested numerous nanotube interconnects between metal electrodes. NIST test results, described at a conference this week, show that nanotubes can sustain extremely high current densities (tens to hundreds of times larger than that in a typical semiconductor circuit) for several hours but slowly degrade under constant current. Of greater concern, the metal electrodes fail—the edges recede and clump—when currents rise above a certain threshold. The circuits failed in about 40 hours.”
We haven’t yet reached the point of singing CNTs swan song.
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